International Journal of Computer
Trends and Technology

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Volume 4 | Issue 10 | Year 2013 | Article Id. IJCTT-V4I10P158 | DOI : https://doi.org/10.14445/22312803/IJCTT-V4I10P158

An Optimal Swarm Intelligence Approach For Test Sequence Restructuring To Conserve Power Usage In VLSI Testing

Y. Sreenivasula Goud, Dr.B.K.Madhavi

Citation :

Y. Sreenivasula Goud, Dr.B.K.Madhavi, "An Optimal Swarm Intelligence Approach For Test Sequence Restructuring To Conserve Power Usage In VLSI Testing," International Journal of Computer Trends and Technology (IJCTT), vol. 4, no. 10, pp. 3693-3696, 2013. Crossref, https://doi.org/10.14445/22312803/IJCTT-V4I10P158

Abstract

Energy dissipation during testing has been discovered to be more than during regular mode due to increased switching activity. Test Sequence restructuring approach helps mitigate this problem as it allows the decrease of switching action during testing. This research presents a new Test Sequence restructuring approach. A cross model of genetic and pharaonis algorithms devised to restructure the test sequence. The model devised here is empirically verified with ISCAS’85standard circuits that evident the minimization of switching activity to approximately to 32%.

Keywords

VLSI testing, swarm intelligence Testing, Test Sequence Restructuring,

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